Influence of the substrate on the solid-state reaction of ultra-thin Ni film with a In_0.53Ga_0.47As under-layer by means of full 3D reciprocal space mapping
نویسندگان
چکیده
We studied the solid-state reaction of Ni thin films with InGaAs layers grown on InP or Si substrates. The intermetallics obtained carried an hexagonal structure, but yielded a difference in orientation regarding either the substrates or the annealing temperature.
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تاریخ انتشار 2018